Keith A. Jenkins, John D. Cressler
IEEE T-ED
A technique is presented to measure the temperature of a large, dense, CMOS clock buffer while it is operating. The technique uses the subthreshold slope of a single pFET, thereby avoiding introducing special technology enhancements for thermal sensing, and uses purely simple electrical measurements. The technique is demonstrated to work in the presence of high-frequency digital switching in a realistic test site fabricated in a 14 nm finFET technology.
Keith A. Jenkins, John D. Cressler
IEEE T-ED
Tian Xia, Peilin Song, et al.
ETS 2004
Rahul Rao, Keith A. Jenkins, et al.
IEEE Journal of Solid-State Circuits
Joachim N. Burghartz, Michael Hargrove, et al.
IEEE Transactions on Electron Devices