Keith A. Jenkins, J.Y.-C. Sun
IEEE Electron Device Letters
Paper
Measurement of PLL phase error caused by power supply noise
Abstract
The measurement of the accumulated phase error of phase-locked loops (PLLs) in microprocessor systems is discussed. A system which creates controlled power supply noise and measures the PLL response is described. Examples of the use of this technique are shown for a PLL used in a 400MHz microprocessor.
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