P.M. Mooney, J.O. Chu
Annual Review of Materials Science
Strained Si devices exhibit enhanced carrier mobility compared to that of standard Si CMOS devices of the same dimensions. Recent strained Si CMOS device results are reviewed. Materials issues related to the strained Si/relaxed SiGe heterostructures required for a strained Si CMOS technology are discussed.
P.M. Mooney, J.O. Chu
Annual Review of Materials Science
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Quantum Information Processing
J.C. Tsang, P.M. Mooney, et al.
Journal of Applied Physics
L.J. Klein, K.L.M. Lewis, et al.
Journal of Applied Physics