Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
This paper discusses material/device and fabrication problems related to the high-power performance of fundamental-mode GaAs/AlGaAs and InGaAs/AlGaAs laser diodes. Various views on the stability of these devices and their degradation are presented. Bulk-, mirror- and ohmic-contact-related issues, including the physics/chemistry of defect formation, are discussed. © 1997 Elsevier Science S.A.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery