R.R. Schlittler, J.K. Gimzewski
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Paper
Low-temperature ultra-high-vacuum scanning tunneling microscope
Abstract
We describe a new scanning tunneling microscope designed specifically for use in an ultra-high-vacuum low-temperature environment. The concept is based on an instrument with interchangeable tip, probe, and a remotely manipulated STM head. The instrumental performance and initial images of a Au(110)(1×2) reconstructed surface obtained with atomic resolution at T ≈ 10 K are presented. © 1992.
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