Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Paper

01 Jan 1988

Low-energy neutral/ion backscattering at As/Si(001)

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Abstract

No abstract available.

Conference paper

NEW RELIABLE STRUCTURE FOR HIGH TEMPERATURE MEASUREMENT OF SILICON WAFERS USING A SPECIALLY ATTACHED THERMOCOUPLE.

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MRS Proceedings 1983

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Journal of Physics and Chemistry of Solids

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Current saturation in submicrometer graphene transistors with thin gate dielectric: Experiment, simulation, and theory

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