J. Tersoff
Applied Surface Science
A force microscope has been used to deposit and image localized charge on insulating surfaces. The charge is deposited either by applying a voltage pulse to the microscope tip or by contact charging the insulator surface with the tip. An improved mode of charge imaging is presented, which distinguishes between charge and topography and allows the sign of the charge to be determined in a single scan. © 1990, American Vacuum Society. All rights reserved.
J. Tersoff
Applied Surface Science
Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011
R. Ghez, M.B. Small
JES
Eloisa Bentivegna
Big Data 2022