Publication
Applied Physics Letters
Paper

Local thickness determination of thin insulator films via localized states

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Abstract

We propose measuring the lifetime of localized states below the conduction band to determine the local thickness of thin insulating films using scanning tunneling microscopy. The lifetime, which is a characteristic fingerprint of the film thickness, is inversely proportional to the saturation value of the tunnel current through the localized state at close tip-sample separation and is readily measured using scanning tunneling spectroscopy. We demonstrate the method for 5-11 monolayer thick NaCl films grown on Cu(111). © 2014 AIP Publishing LLC.

Date

11 Jun 2014

Publication

Applied Physics Letters

Authors

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