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Publication
Physical Review Letters
Paper
Linearity of 1f noise mechanisms
Abstract
Measurements of statistical quantities other than the spectrum can distinguish between different 1f noise mechanisms. One such quantity, the average behavior before and after a given fluctuation amplitude, is used to determine if the noise mechanism is linear. Measurements on different sources show that 1f noise in some systems, such as carbon resistors and field-effect transistors, is due to a linear mechanism, while other systems, such as p-n junction devices, require a nonlinear mechanism. © 1978 The American Physical Society.