Conference paper
E-beam inspection of EUV mask defects: To etch or not to etch?
Ravi Bonam, Hung-Yu Tien, et al.
SPIE Advanced Lithography 2014
Three dimensional nanostructures are of great interest in photonics and optical sensor communities. Although there are many theoretical models developed, lithographic reduction to practice is an ongoing challenge. Numerous lithographic techniques have been proposed for fabricating three dimensional structures with applications in photonics. We demonstrate a novel three-dimensional electron beam fabrication method that is precise, fast, intrinsically self-aligned and has the ability to produce large area patterns.
Ravi Bonam, Hung-Yu Tien, et al.
SPIE Advanced Lithography 2014
Ravi Bonam, John G. Hartley
JVSTB
Ravi Bonam, Chi Chun Liu, et al.
SPIE Advanced Lithography 2017
Ravi Bonam, R. Muthinti, et al.
SPIE Advanced Lithography 2017