Conference paperExperience with the in situ monitor system for the fabrication of x-ray mirrorsEberhard SpillerProceedings of SPIE 1989
PaperSpecimen replication for electron microscopy using x rays and x-ray resistRalph Feder, David Sayre, et al.Journal of Applied Physics
PaperSummary Abstract: Multilayer thin films for x-ray opticsEberhard SpillerJournal of Vacuum Science and Technology A: Vacuum, Surfaces and Films