A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Paper
Kronig-Penney-type calculations for electron tunneling through thin disordered dielectric films
Abstract
Kronig-Penney-type calculations were used to evaluate the tunneling probability through a thin disordered dielectric film between two metallic electrodes. Our calculations indicate that the tunneling probability increases with increasing disorder. © 1972.
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