Conference paper
Profiling Memory Vulnerability of Big-Data Applications
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DSN-W 2016
Jitter is one of the most important issues in the design and operation of high-speed serial links. This article focuses on the BERT scan method, a jitter characterization method based on scanning the bit-error rate within the eye diagram. © 2004 IEEE.
Navaneeth Rameshan, Robert Birke, et al.
DSN-W 2016
Thomas Toifl, Christian Menolfi, et al.
IEEE Journal of Solid-State Circuits
Marcel Kossel, Thomas Morf, et al.
IEEE Journal of Solid-State Circuits
Animesh Trivedi, Patrick Stuedi, et al.
ICDCS 2015