J.A. Reimer, B.A. Scott, et al.
Applied Physics Letters
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75 show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon were p-type with a charge carrier density of the order of 4×1017 cm -3.
J.A. Reimer, B.A. Scott, et al.
Applied Physics Letters
S. Petersson, R.L. Anderson, et al.
Journal of Applied Physics
J.M. Hvam, M.H. Brodsky
Physical Review Letters
J. De Sousa Pires, F.M. D'Heurle, et al.
Applied Physics Letters