Publication
Journal of Applied Physics
Paper

Interaction force detection in scanning probe microscopy: Methods and applications

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Abstract

Fundamental aspects of interaction force detection and force microscopy are discussed. A formalism is developed for studying the dynamics of experimental setups in general terms. The analysis focuses on stability criteria and resonant properties of the force sensor. The latter are important for measuring interaction force gradients. Experimental techniques used for interaction force detection are examined in detail. Finally, experimental results are presented that demonstrate the potential of combining atomic scale interaction force detection with scanning tunneling microscopy.

Date

01 Dec 1992

Publication

Journal of Applied Physics

Authors

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