J. Falta, M.C. Reuter, et al.
Applied Physics Letters
Low-energy electron microscopy (LEEM) is a relatively new technique for real-time imaging of surfaces. Lateral resolution is in the 150 Å range and single-height atomic steps can be observed. In this paper we describe how to set up a low-energy electron microscope and obtain images in the different imaging modes. © 1993.
J. Falta, M.C. Reuter, et al.
Applied Physics Letters
F.K. LeGoues, M. Hammar, et al.
Surface Science
M.C. Reuter, R.M. Tromp
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
S. Tanaka, C.C. Limbach, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films