Conference paper
A shorted global clock design for multi-GHz 3D stacked chips
Liang-Teck Pang, Phillip J. Restle, et al.
VLSI Circuits 2012
Paper
IIIB-1 Degradation of 77-K MOSFET Characteristics Due to Channel Hot Electrons
Abstract
No abstract available.
Related
Toshiaki Kirihata, Hing Wong, et al.
IEEE Journal of Solid-State Circuits
Toshiaki Kirihata, Yohji Watanabe, et al.
IEICE Transactions on Electronics
Toshiaki Kirihata, Yohji Watanabe, et al.
IEEE Journal of Solid-State Circuits