Storage Area Networks (SAN) solutions are highly complex, often with enterprise class quality requirements. To perform end-to-end customer-like SAN testing, multiple complex interoperability test labs are necessary. One key factor in field quality is test coverage; in distributed test environments this requires a centralized view and coverage model across the different areas of test. We define centralized coverage models and apply our novel trace coverage technology to automatically populate these models. Early results indicate that we are able to create a centralized view of SAN coverage across the multitude of IBM test labs worldwide. Moreover, we are able to compare test lab coverage models with customer environments. Based on these views and comparisons, we expect to obtain an increased coverage, resulting in increased discovery rate of high-impact defects.