Y. Martin, D. Rugar, et al.
Applied Physics Letters
A high-resolution thermal microscope was demonstrated capable of imaging thermal fields with sub 1000-angstrom resolution. It is based on a noncontacting near-field thermal probe. The thermal probe consists of a thermocouple sensor on the end of a tip with sub 1000-angstrom dimensions. The probe tip is scanned in close proximity to a solid or liquid surface and the local temperature is mapped with a resolution determined by the size of the tip. Material-independent surface profiling was also demonstrated with the thermal probe, providing a lateral resolution of approximately 300 angstrom. Temperature mapping and surface profiling results are presented on both electronic and biological materials.
Y. Martin, D. Rugar, et al.
Applied Physics Letters
M. Nonnenmacher, M. Vaez-Iravani, et al.
Review of Scientific Instruments
T.G. Van Kessel, H.K. Wickramasinghe
Optics Letters
M. Nonnenmacher, H.K. Wickramasinghe
Applied Physics Letters