E. Spiller, I. Hailer, et al.
Applied Optics
X-ray micrographs of biological materials have been obtained with a resolution better than 100 angstroms by using x-ray resist as the recording medium. A high-resolution scanning electron microscope with a short-focal-length final lens, operating in the "low-loss" mode, is used to make the smallest features in the x-ray replica visible.
E. Spiller, I. Hailer, et al.
Applied Optics
L.J. Terminello, A.B. McLean, et al.
Review of Scientific Instruments
E. Spiller, R.A. McCorkle, et al.
Optical and Optoelectronic Applied Science and Engineering 1990
R. Feder, E. Spiller, et al.
Polymer Engineering & Science