D. Kern, P. Coane, et al.
Proceedings of SPIE 1989
X-ray micrographs of biological materials have been obtained with a resolution better than 100 angstroms by using x-ray resist as the recording medium. A high-resolution scanning electron microscope with a short-focal-length final lens, operating in the "low-loss" mode, is used to make the smallest features in the x-ray replica visible.
D. Kern, P. Coane, et al.
Proceedings of SPIE 1989
R. Harmon, R. Rosner, et al.
Astrophysical Journal
M. Pomerantz, J.C. Slonczewski, et al.
Journal of Magnetism and Magnetic Materials
Mario G. Baldini, B.K. Kim, et al.
Proceedings of SPIE 1989