PublicationIEDM 2007Conference paperHigh performance CMOS variability in the 65nm regime and beyondIEDM 2007View publicationAbstractNo abstract available.Home↳ PublicationsDate01 Dec 2007PublicationIEDM 2007AuthorsSani NassifKerry BernsteinDavid J. FrankAnne GattikerWilfried HaenschBrian L. JiEd NowakDale PearsonNorman J. RohrerIBM-affiliated at time of publicationTopicsPhysical SciencesShare