Conference paper
High performance CMOS variability in the 65nm regime and beyond
Sani Nassif, Kerry Bernstein, et al.
IEDM 2007
We report electrical measurements of the radio frequency response of carbon nanotube field-effect transistors (CNFETs). The very low current drive of CNFETs makes conventional high-frequency measurements difficult. To overcome this problem, we have used a novel approach to easily measure the response up to 250 MHz in nonoptimized experimental conditions. We observe a clear response of our CNFETs with no deterioration in signal up to at least 250 MHz, which is the limit for our present configuration.
Sani Nassif, Kerry Bernstein, et al.
IEDM 2007
Yu-Ming Lin, Joerg Appenzeller, et al.
Nano Letters
Yu-Ming Lin, Joerg Appenzeller, et al.
Nano Letters
Hiroshi Miki, Naoki Tega, et al.
IEDM 2010