Fair and Comprehensive Benchmarking of Machine Learning Processing Chips

Geoffrey W. Burr; SukHwan Lim; Boris Murmann; Rangharajan Venkatesan; Marian Verhelst

doi:10.1109/MDAT.2021.3063366

IEEE Design and Test

Review

31 May 2022

Fair and Comprehensive Benchmarking of Machine Learning Processing Chips

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Abstract

This article provides an overview of benchmarking strategies at a different set of abstraction levels and related best practices in each, while working to also give an overall view of impact.

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Abstract

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