Microscopy and Microanalysis

Paper

15 Jul 2003

Experience with the IBM sub-angstrom STEM

Abstract

No abstract available.

Paper

Silicon L_{2, 3} near-edge fine structure in confined volumes

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Ultramicroscopy

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Participation of carbon in the electronic structure of YBa2Cu3O7

P.E. Batson, T.M. Shaw, et al.

Physical Review B

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Structural and electronic characterization of a dissociated dislocation in GeSi

P.E. Batson

Physical Review B - CMMP

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Carbon 1s near-edge-absorption fine structure in graphite

P.E. Batson

Physical Review B

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