Microscopy and Microanalysis

Paper

15 Jul 2003

Experience with the IBM sub-angstrom STEM

Abstract

No abstract available.

Paper

Resolution enhancement by deconvolution using a field emission source in electron energy loss spectroscopy

P.E. Batson, D.W. Johnson, et al.

Ultramicroscopy

Paper

Symmetry-selected electron-energy-loss scattering in diamond

P.E. Batson

Physical Review Letters

Paper

Atomic and electronic structure of a dissociated 60° misfit dislocation in Ge_xSi(_1-x)

P.E. Batson

Physical Review Letters

Paper

Control of parasitic aberrations in multipole corrector optics

P.E. Batson

Microscopy and Microanalysis

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