Microscopy and Microanalysis

Paper

15 Jul 2003

Experience with the IBM sub-angstrom STEM

Abstract

No abstract available.

Paper

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Ultramicroscopy

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The IBM computer-stem system

P.E. Batson, G. Trafas

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Structural and electronic characterization of a dissociated dislocation in GeSi

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Physical Review B - CMMP

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