Microscopy and Microanalysis

Paper

15 Jul 2003

Experience with the IBM sub-angstrom STEM

Abstract

No abstract available.

Paper

Atomic resolution analytical microscopy

P.E. Batson

IBM J. Res. Dev

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Prospects for high-resolution electron energy-loss experiments with the scanning transmission electron microscope

P.E. Batson

Ultramicroscopy

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Electron microscope studies of an alloyed Au/Ni/Au-Ge ohmic contact to GaAs

T.S. Kuan, P.E. Batson, et al.

Journal of Applied Physics

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Surface Plasmon Coupling in Clusters of Small Spheres

P.E. Batson

Physical Review Letters

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