Microscopy and Microanalysis

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15 Jul 2003

Experience with the IBM sub-angstrom STEM

Abstract

No abstract available.

Paper

High-energy resolution electron spectrometer for 1-nm spatial analysis

P.E. Batson

Review of Scientific Instruments

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Parallel detection for high-resolution electron energy loss studies in the scanning transmission electron microscope

P.E. Batson

Review of Scientific Instruments

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Examination of flatband and threshold voltage tuning of HfO₂/TiN field effect transistors by dielectric cap layers

S. Guha, V.K. Paruchuri, et al.

Applied Physics Letters

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Graded electronic structure in a 3 nm strained Ge40Si60 quantum well

P.E. Batson, J.F. Morar

Physical Review Letters

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