C.Y. Wong, C.R.M. Grovenor, et al.
Journal of Applied Physics
Paper
Experience with the IBM sub-angstrom STEM
Abstract
No abstract available.
Related
P.E. Batson
Scanning Electron Microscopy
P.E. Batson, D.W. Johnson, et al.
Ultramicroscopy
J.A. Van Vechten, W. Solberg, et al.
Journal of Crystal Growth