Microscopy and Microanalysis

Paper

15 Jul 2003

Experience with the IBM sub-angstrom STEM

Abstract

No abstract available.

Paper

Distortion of the core exciton by the swift electron and plasmon wake in spatially resolved electron-energy-loss scattering

P.E. Batson

Physical Review B

Paper

Single electron calculations for the Si L_{2, 3} near edge structure

Xudong Weng, Peter Rez, et al.

Solid State Communications

Paper

Parallel detection for high-resolution electron energy loss studies in the scanning transmission electron microscope

P.E. Batson

Review of Scientific Instruments

Conference paper

Band-edge high-performance high-κ /metal gate n-MOSFETs using cap layers containing group IIA and IIIB elements with gate-first processing for 45 nm and beyond

V. Narayanan, V.K. Paruchuri, et al.

VLSI Technology 2006

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