R.T. Kerth, K. Jain, et al.
IEEE Electron Device Letters
Direct photoetching of various resists and polymers with a 193-nm ArF excimer laser has been demonstrated by imaging a mask through a projection lens. Feature sizes ranging from 2 to 20 μm have been cleanly etched in 1-μm-thick films.
R.T. Kerth, K. Jain, et al.
IEEE Electron Device Letters
M.R. Latta, R.V. Pole
Applied Optics
M.R. Latta, S.L. Heesacker
Proceedings of SPIE 1989
W.J. Kozlovsky, A.G. Dewey, et al.
SPIE Optical Data Storage Topical Meeting 1992