John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
No abstract available.
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
Zhihua Xiong, Yixin Xu, et al.
International Journal of Modelling, Identification and Control
David L. Shealy, John A. Hoffnagle
SPIE Optical Engineering + Applications 2007
Robert F. Gordon, Edward A. MacNair, et al.
WSC 1985