D.N. McIlroy, D. Heskett, et al.
Physical Review B
New low-energy electron-diffraction intensity measurements and dynamical calculations indicate that oxygen in a c(2×2) overlayer resides 0.800.025 above the top layer of Ni atoms and is displaced 0.300.1 from the fourfold hollow position along a 110 direction. This produces a structure having C2V symmetry with two inequivalent nearest-neighbor Ni-O bond distances of 1.750.05 and 2.140.08. © 1983 The American Physical Society.
D.N. McIlroy, D. Heskett, et al.
Physical Review B
G.S. Cargill III, A.C. Ho, et al.
Materials Research Society Symposium - Proceedings
Ph. Avouris, J.E. Demuth, et al.
JVSTA
T. Hashizume, R.J. Hamers, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films