N.J. DiNardo, J.E. Demuth, et al.
Review of Scientific Instruments
New low-energy electron-diffraction intensity measurements and dynamical calculations indicate that oxygen in a c(2×2) overlayer resides 0.800.025 above the top layer of Ni atoms and is displaced 0.300.1 from the fourfold hollow position along a 110 direction. This produces a structure having C2V symmetry with two inequivalent nearest-neighbor Ni-O bond distances of 1.750.05 and 2.140.08. © 1983 The American Physical Society.
N.J. DiNardo, J.E. Demuth, et al.
Review of Scientific Instruments
Mahesh G. Samant, Clifford J. Robinson, et al.
Journal of Non-Crystalline Solids
H.K. Kao, G.S. Cargill III, et al.
Materials Research Society Symposium - Proceedings
P.M. Marcus, J.E. Demuth, et al.
Surface Science