J.E. Demuth, B.N.J. Persson, et al.
Physical Review Letters
Paper
Ultrahigh-vacuum sample transfer device with low-temperature capability
Abstract
The design of a novel sample transfer device for use in surface studies in an ultrahigh-vacuum environment is discussed. The principle feature of this design is a broad sample temperature range (∼32-∼1270 K).
Related
R.J. Hamers, R.M. Tromp, et al.
Physical Review B
D. Schmeisser, J.E. Demuth
Journal of Electron Spectroscopy and Related Phenomena
J.E. Demuth, N.J. DiNardo, et al.
Physical Review B