Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Using an algorithm to analyze opportunistically collected mobile phone location data, the authors estimate weekday and weekend travel patterns of a large metropolitan area with high accuracy. © 2011 IEEE.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Frank R. Libsch, S.C. Lien
IBM J. Res. Dev
Ohad Shamir, Sivan Sabato, et al.
Theoretical Computer Science
Thomas M. Cover
IEEE Trans. Inf. Theory