About cookies on this site Our websites require some cookies to function properly (required). In addition, other cookies may be used with your consent to analyze site usage, improve the user experience and for advertising. For more information, please review your options. By visiting our website, you agree to our processing of information as described in IBM’sprivacy statement. To provide a smooth navigation, your cookie preferences will be shared across the IBM web domains listed here.
Publication
EOS/ESD 2010
Conference paper
ESD events of cabled GMR sensors
Abstract
ESD damage from cable discharge events (CDEs) of magnetoresistive sensors is a major problem in manufacturing of magnetic tape and hard disk drives. CDEs initiated by contact to the cable pads used to connect to external electronics represent one source. This paper addresses CDEs from other points of contact, including capacitive coupling to metal objects contacting the cable. In order for capacitively coupled ESD events to damage the sensor the capacitive coupling of the two sensor leads to the external object being discharge must be different.