A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
Results are presented detailing the crystallographic quality of a number of metal films deposited by epitaxial sputter deposition. Such films have single-orientation f.c.c., h.c.p., b.c.c. and hybrid crystal structures, and include the elements Ag, Au, Co, Cr, Cu, Fe, Rh, Ru, Pd and V. The crystal structure was characterized using X-ray diffraction analysis.
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
T. Schneider, E. Stoll
Physical Review B
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings