R.J. Von Gutfeld, J.R. Lankard
Opto-electronics
A correlation between the surface morphology of slant-angle deposited films and the magnitude of the transverse thermoelectric voltage has been observed. This finding has been mainly responsible for the fabrication of optical detectors with responsivities greatly enhanced over those previously reported, extending to 10.6 μ and into the cw range. © 1974 American Institute of Physics.
R.J. Von Gutfeld, J.R. Lankard
Opto-electronics
R.J. Von Gutfeld
Applied Physics Letters
H.L. Caswell
Solid State Communications
R.J. Von Gutfeld, R.L. Melcher
Applied Physics Letters