G. Burks, F.H. Dill, et al.
Proceedings of the IEEE
A novel method involving internal photoemission has been developed to determine the conduction band discontinuity Δ Ec of heterojunctions. The method is straightforward, accurate, and assumes minimum unknowns; and has been applied to GaAs/AlxGa1-xAs heterojunctions. We have found for x<0.4 that Δ Ec≅0.62 Δ Eg, where Δ Eg is the band-gap difference. For x>0.4, the apparent Δ Ec is considerably smaller.
G. Burks, F.H. Dill, et al.
Proceedings of the IEEE
Chin-An Chang, M. Heiblum, et al.
Applied Physics Letters
E.Y. Andrei, D.C. Glattli, et al.
Surface Science
I. Geppert, M. Eizenberg, et al.
ECS Transactions