M. Chen, V. Marrello, et al.
Physical Review B
We report a direct measurement of relative Mn electroluminescence (EL) efficiency in an ac EL device as a function of position normal to the ZnS film plane. The Mn EL efficiency decreases strongly with distance from the cathodic to anodic region of the ZnS layer. The cathodic-to-anodic efficiency ratio is about two orders of magnitude. In addition, the first ∼0.2 μm of ZnS deposited exhibits a significantly lower Mn EL efficiency relative to the remaining ZnS.
M. Chen, V. Marrello, et al.
Physical Review B
V. Marrello, W. Rühle, et al.
Applied Physics Letters
H. Rüfer, V. Marrello, et al.
IEEE T-ED
V. Marrello, M. Chen, et al.
CLEO 1982