PublicationIEEE International SOI Conference 1992Conference paperEffect of total dose radiation on device self latch-upIEEE International SOI Conference 1992View publicationAbstractNo abstract available.Home↳ PublicationsDate06 Oct 1992PublicationIEEE International SOI Conference 1992AuthorsF.T. BradyN. HaddadL.K. WangIBM-affiliated at time of publicationShare
