S. Ciraci, Inder P. Batra
Surface Science
Adopting the empirical silicon interatomic potential of Stillinger and Weber, we investigate the effect of the tip profile on the atomic-force microscope images for a prototype system, Si(001)-(2×1), and conclude that the tip profile has a profound effect on the observations. We also study relaxation of the surface under the influence of the tip using a many-body energy minimization procedure and find that the force exerted by the tip should be less than 10-9 N for the atomic-force microscope to be a nondestructive tool. © 1988 The American Physical Society.
S. Ciraci, Inder P. Batra
Surface Science
Inder P. Batra, P.S. Bagus, et al.
Physical Review B
Rashmi C. Desai, S.W. Koch, et al.
Physica A: Statistical Mechanics and its Applications
Farid F. Abraham
Physical Review B