M.I. Nathan, T.N. Morgan, et al.
Physical Review
Paper
Effect of Deep Traps on Capacitance, Current, and Light Output of Junctions
Abstract
No abstract available.
Related
T.N. Morgan
Journal of Physics and Chemistry of Solids
T.N. Morgan, M.H. Pilkuhn, et al.
Physical Review
T.N. Morgan
Journal of Electronic Materials