Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
The Helios compact synchrotron installed at IBM's Advanced Lithography Facility provides a unique opportunity to obtain compact synchrotron reliability data in an industrial environment. This paper presents data from the first eight months of user oriented operation of the machine. Running and uptime statistics are tabulated, as well as achieved performance parameters. Unscheduled downtime in the various subsystems is described. © 1993.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
P.C. Pattnaik, D.M. Newns
Physical Review B
A. Gangulee, F.M. D'Heurle
Thin Solid Films