Rahul Rao, Keith A. Jenkins, et al.
IEEE Journal of Solid-State Circuits
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
Rahul Rao, Keith A. Jenkins, et al.
IEEE Journal of Solid-State Circuits
John Liobe, Keith A. Jenkins
RFIC 2005
Chun Yung Sung, Yu-Ming Lin, et al.
VLSI-TSA 2010
Mark B. Ketchen, Manjul Bhushan, et al.
IEEE International SOI Conference 2005