Han-Su Kim, Ya-Hong Xie, et al.
Journal of Applied Physics
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
Han-Su Kim, Ya-Hong Xie, et al.
Journal of Applied Physics
Pong-Fei Lu, James D. Warnock, et al.
IEEE T-ED
Saibal Mukhopadhyay, Keunwoo Kim, et al.
IEEE Journal of Solid-State Circuits
Anup P. Jose, Keith A. Jenkins, et al.
VTS 2005