Christos Dimitrakopoulos, Yu-Ming Lin, et al.
Journal of Vacuum Science and Technology B
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
Christos Dimitrakopoulos, Yu-Ming Lin, et al.
Journal of Vacuum Science and Technology B
Keith A. Jenkins, Alan J. Weger
IEEE Electron Device Letters
Yanqing Wu, Keith A. Jenkins, et al.
Nano Letters
Joachim N. Burghartz, Jean-Olivier Plouchart, et al.
IEEE Electron Device Letters