John D. Cressler, James Warnock, et al.
IEEE Electron Device Letters
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
John D. Cressler, James Warnock, et al.
IEEE Electron Device Letters
Keith A. Jenkins, Lionel Li
VTS 2009
Jonghae Kim, Jean-Olivier Plouchart, et al.
VLSI Circuits 2003
Stas Polonsky, Keith A. Jenkins
ISDRS 2003