Detecting and preventing measurement errors

Keith A. Jenkins

doi:10.1109/54.632884

IEEE Design and Test of Computers

Paper

01 Oct 1997

Detecting and preventing measurement errors

View publication

Abstract

Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.

Paper

High-speed logic integrated circuits with solution-processed self-assembled carbon nanotubes

Shu Jen Han, Jianshi Tang, et al.

Nature Nanotechnology

Conference paper

Performance impact of through-silicon vias (TSVs) in three-dimensional technology measured by SRAM ring oscillators

Jente B. Kuang, Keith A. Jenkins, et al.

ESSCIRC 2013

Conference paper

Record high RF performance for epitaxial graphene transistors

Yanqing Wu, Damon Farmer, et al.

IEDM 2011

Paper

Quantitative image mode voltage contrast

Keith A. Jenkins

Scanning

View all publications

Abstract

Related

High-speed logic integrated circuits with solution-processed self-assembled carbon nanotubes

Performance impact of through-silicon vias (TSVs) in three-dimensional technology measured by SRAM ring oscillators

Record high RF performance for epitaxial graphene transistors

Quantitative image mode voltage contrast