Conference paper
Graphene technology for RF and THz applications
Alberto Valdes-Garcia, Fengnian Xia, et al.
IMS 2013
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
Alberto Valdes-Garcia, Fengnian Xia, et al.
IMS 2013
Keith A. Jenkins, Alan J. Weger
IEEE Electron Device Letters
Mehmet Soyuer, Joachim N. Burghartz, et al.
IEEE Journal of Solid-State Circuits
Jonghae Kim, Jean-Olivier Plouchart, et al.
RFIC 2003