Joachim N. Burghartz, Mehmet Soyuer, et al.
IEEE T-MTT
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
Joachim N. Burghartz, Mehmet Soyuer, et al.
IEEE T-MTT
Jonghae Kim, Jean-Olivier Plouchart, et al.
RFIC 2003
Shu-Jen Han, Satoshi Oida, et al.
IEEE Electron Device Letters
Jonghae Kim, Jean-Olivier Plouchart, et al.
VLSI Circuits 2003