Joachim N. Burghartz, D. Edelstein, et al.
IEEE Journal of Solid-State Circuits
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
Joachim N. Burghartz, D. Edelstein, et al.
IEEE Journal of Solid-State Circuits
Joachim N. Burghartz, Keith A. Jenkins, et al.
IEEE Electron Device Letters
Han-Su Kim, Ya-Hong Xie, et al.
Journal of Applied Physics
Shu-Jen Han, Satoshi Oida, et al.
DRC 2013