Joachim N. Burghartz, Daniel C. Edelstein, et al.
IEEE T-MTT
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
Joachim N. Burghartz, Daniel C. Edelstein, et al.
IEEE T-MTT
Ph. Avouris, Yu-Ming Lin, et al.
IEDM 2010
Rahul Rao, Keith A. Jenkins, et al.
IEEE Journal of Solid-State Circuits
Saibal Mukhopadhyay, Keunwoo Kim, et al.
ISSCC 2007