Conference paper
RF performance of short channel graphene field-effect transistor
Yanqing Wu, Yu-Ming Lin, et al.
IEDM 2010
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
Yanqing Wu, Yu-Ming Lin, et al.
IEDM 2010
Joachim N. Burghartz, Keith A. Jenkins, et al.
IEEE Electron Device Letters
Jean-Olivier Plouchart, Noah Zamdmer, et al.
IBM J. Res. Dev
John U. Knickerbocker, Paul S. Andry, et al.
IBM J. Res. Dev