Franco Stellari, Keith A. Jenkins, et al.
IEEE T-ED
The linearity of the radio frequency response of graphene field-effect transistors has been measured as a function of gate bias using the two-tone method. Two kinds of transistors, which differ in both the graphene source material and the device structure, have been compared. Both devices show high linearity compared to contemporary silicon transistors. The physical origins of this behavior are analyzed and discussed. © 2013 AIP Publishing LLC.
Franco Stellari, Keith A. Jenkins, et al.
IEEE T-ED
Pong-Fei Lu, Keith A. Jenkins, et al.
Microelectronics Reliability
Jonghae Kim, Jean-Olivier Plouchart, et al.
RFIC 2003
Christos Dimitrakopoulos, Yu-Ming Lin, et al.
Journal of Vacuum Science and Technology B