J. Tersoff
Applied Surface Science
The density of states in heavily doped silicon can be derived from the electronic effect on a shear elastic constant. The density of states found in this way confirms the anomalous values obtained from specific heat measurements. © 1979.
J. Tersoff
Applied Surface Science
Michiel Sprik
Journal of Physics Condensed Matter
Peter J. Price
Surface Science
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009