K.C. Park, M. Berkenblit, et al.
Journal of Electronic Materials
The density of vapor-deposited "amorphous" Ge was determined from x-ray-diffraction absorption measurements and found to be the same as the density of crystalline Ge within ±5%. © 1969 The American Physical Society.
K.C. Park, M. Berkenblit, et al.
Journal of Electronic Materials
J.W. Matthews, S. Mader, et al.
Journal of Applied Physics
E. Stern, T.B. Light
Applied Physics Letters
R. Feder, T.B. Light
Journal of Applied Physics