Conference paper
Nanomechanical nose
H.P. Lang, M.K. Baller, et al.
MEMS 1999
We show that by measuring force and stiffness on a constant-current scanning tunnelling microscopy (STM) contour a deformation-free topography can be extracted. Withreference to mono- and bicomponent self-assembled monolayers, we find that the characteristicdepression pattern and the protrusions on a multicomponent film found in STM are to a greatextent due to electronic effects. © 1993 IOP Publishing Ltd.
H.P. Lang, M.K. Baller, et al.
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