J.B. Hannon, R.M. Tromp
Physical Review B - CMMP
The intermixing of Ge on Si(001) during growth was enhanced on stepped surfaces and terraces was discussed. The study was carried out by using a low-energy electron microscopy. A dynamic and unanticipated structural rearrangement was identified that facilitates intermixing. The results show that the driving force for step formation was the entropy gain associated with the enhanced intermixing of Ge.
J.B. Hannon, R.M. Tromp
Physical Review B - CMMP
Z. Luo, T.P. Ma, et al.
International Symposium on VLSI Technology, Systems, and Applications, Proceedings
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Applied Physics Letters
D.G.J. Sutherland, H. Akatsu, et al.
Journal of Electron Spectroscopy and Related Phenomena