Workshop paperIdentifying Extreme Regimes in Climate-Scale Digital Twins: a RoadmapEloisa BentivegnaBig Data 2022
Conference paperSelf-assembling materials for lithographic patterning: Overview, status and moving forwardWilliam Hinsberg, Joy Cheng, et al.SPIE Advanced Lithography 2010
PaperHarmonic analysis in rheological property measurementThomas E. Karis, C. Mark Seymour, et al.Rheologica Acta