R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
We have measured the 1/f noise of simultaneously and identically prepared submicron-scale gold samples with none or only a few grain boundaries. We consistently observed that the samples with the lowest number of grain boundaries produced the lowest noise. In addition, micron-scale single-crystalline gold samples when measured displayed about (1/3) of the noise of similar polycrystalline samples. This is strong evidence that a significant part of the 1/f noise of a gold sample is related to atomic motion near or along a grain boundary. © 1987 The American Physical Society.
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997
D.D. Awschalom, J.-M. Halbout
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