Conference paper
Aberration correction results in the IBM STEM instrument
P.E. Batson
Ultramicroscopy
P.E. Batson
Ultramicroscopy
P.E. Batson, T.M. Shaw, et al.
Physical Review B
S. Subramanian, D.A. Muller, et al.
Materials Science and Engineering A
P.E. Batson
MSA Annual Meeting 1993