PaperSimultaneous STEM imaging and electron energy-loss spectroscopy with atomic-column sensitivityP.E. BatsonNature
PaperLocal bonding and electronic structure obtained from electron energy loss scatteringP.E. Batson, K.L. Kavanagh, et al.Ultramicroscopy
Conference paperBand-edge high-performance high-κ /metal gate n-MOSFETs using cap layers containing group IIA and IIIB elements with gate-first processing for 45 nm and beyondV. Narayanan, V.K. Paruchuri, et al.VLSI Technology 2006
Conference paperElemental and electronic characterization of semiconductor materials with the STEMP.E. BatsonProceedings of SPIE 1989
