S. Chiang, R.J. Wilson, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
We have built a combined scanning tunneling and scanning force microscope. Owing to the compact design of the instrument with Nomarski type of interferometry for lever deflection sensing, we achieved excellent stability with a total rms noise of 0.03-0.04 Å in a frequency bandwidth of 0.01 Hz-2 kHz and a spectral noise density of 2.0×10-4 Å/ √Hz at higher frequencies (>2 kHz) using cantilevers with compliances of ∼150 N m-1. Simultaneous measurement of constant current contours, the acting forces, and the system compliance allows separation of sample topography from electronic and elastic effects.
S. Chiang, R.J. Wilson, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
J. Fompeyrine, R. Berger, et al.
SPIE Optical Science, Engineering, and Instrumentation 1998
R. Linderman, T. Brunschwiler, et al.
THERMINIC 2007
Bruno Michel, G. Travaglini
Journal of Microscopy