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Physical Review B
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Comment on carrier-concentration dependence of critical superconducting current induced by the proximity effect in silicon

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Abstract

It is pointed out that effect of an applied gate voltage on the critical current observed in a gate-controlled Si-coupled weak link by Nishino, Yamada, and Kawabe [Phy. Rev. B 33, 2042 (1986)] is much larger than that expected from the small change of carrier density in the link. © 1987 The American Physical Society.

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Physical Review B

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