Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
It is pointed out that effect of an applied gate voltage on the critical current observed in a gate-controlled Si-coupled weak link by Nishino, Yamada, and Kawabe [Phy. Rev. B 33, 2042 (1986)] is much larger than that expected from the small change of carrier density in the link. © 1987 The American Physical Society.
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT
E. Burstein
Ferroelectrics
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007