U.Ch. Fischer, U. Dürig, et al.
Applied Physics Letters
Aperture scanning near-field optical microscopy (SNOM/NSOM) and scanning tunneling optical microscopy (STOM, also known as PSTM) are integrated into an instrument which combines the advantages of both schemes. As a result, more near-field optical information can be obtained and new modes of operation become possible. Scan images of a glass surface with a fine grating relief demonstrate some of the capabilities of the new 'TNOM' technique. © 1995 Elsevier Science B.V. All rights reserved.
U.Ch. Fischer, U. Dürig, et al.
Applied Physics Letters
D. Pohl
Institute of Physics Electron Microscopy and Analysis Group Conference 1991
U. Dürig, D. Pohl, et al.
Journal of Applied Physics
W. Rother, D. Pohl, et al.
Physical Review Letters