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Publication
Ultramicroscopy
Paper
Combined aperture SNOM/PSTM: best of both worlds?
Abstract
Aperture scanning near-field optical microscopy (SNOM/NSOM) and scanning tunneling optical microscopy (STOM, also known as PSTM) are integrated into an instrument which combines the advantages of both schemes. As a result, more near-field optical information can be obtained and new modes of operation become possible. Scan images of a glass surface with a fine grating relief demonstrate some of the capabilities of the new 'TNOM' technique. © 1995 Elsevier Science B.V. All rights reserved.